Availability Measures of Two Unit Parallel Redundant System with Replacement

Reena Grover; Praveen Saraswat; Viresh Sharma

doi:https://doi.org/10.14445/22315373/IJMTT-V51P554

International Journal of Mathematics Trends and Technology

Research Article | Open Access | Download PDF

Volume 51 | Number 6 | Year 2017 | Article Id. IJMTT-V51P554 | DOI : https://doi.org/10.14445/22315373/IJMTT-V51P554

Availability Measures of Two Unit Parallel Redundant System with Replacement

Reena Grover, Praveen Saraswat, Viresh Sharma

Citation :

Reena Grover, Praveen Saraswat, Viresh Sharma, "Availability Measures of Two Unit Parallel Redundant System with Replacement," International Journal of Mathematics Trends and Technology (IJMTT), vol. 51, no. 6, pp. 391-395, 2017. Crossref, https://doi.org/10.14445/22315373/IJMTT-V51P554

Abstract

For the system which has two units in parallel redundancy, the reliability of repairable systems can be calculated as a result of the numerical solution of a simultaneous set of linear differential equations. The closed form solutions of the transient probabilities are used to obtain the reliability for non-repairable systems. The probabilities so obtained can be utilized to estimate the reliability and MTTF of the system.

Keywords

Reliability, Multi-failure, Redundant system, Failure rate, Supplementary variable process.

References

1. Gupta P.P., Singh S.B. and Goel C.K.: Stand by redundant system involving the concepts of multi-failure human failure under head of line repair policy. Bulletin of Pure & Applied Science, Volume 20, pp.345-351.(2001).
2. Mokaddis, G.S.; Tawfak, M.L.: 'Some characteristic of a two dissimilar unit cold stand by redundant with three modes." Micorelectron Reliability, Volume. 36(4), pp 497-504 (1996).
3. Singh, S.B., Goel, C.K. : "Stochastic Behavior of a Complex system involving major and minor failures, International Journal of Essential Sciences. Volume No. 1, (2008).
4. Widder, D.V., “The Laplace Transforms”, Princeton University Press, Princeton New Jersey (1946).
5. Abdul Ameer, Al – Ali, Murari, K; “One unit reliability system subjected to random stocks and Preventive Maintenance”, Microelectron Reliability Volume 28 pp 373-377 (1988).