International Journal of Mathematics Trends and Technology
Volume 66 | Issue 12 | Year 2020 | Article Id. IJMTT-V66I12P520 | DOI : https://doi.org/10.14445/22315373/IJMTT-V66I12P520
In this article, a new compound distribution named as Generalized Exponential-Poisson (GEP) distribution is studied the truncated life test of a sampling plan. Their probability of acceptance for the single sampling is considered along with its associated decision rule are given to obtain the smallest sample size for the three parameter distribution. Under this study, the specified percentile life time is calculated and the design parameter such as sample sizes, acceptance number are determined to satisfying the specified quality levels. OC curve and the minimum ratio values for the specified producer’s risk are obtained and tabulated for the easy selection of the plan parameters. Further, the suitable illustration for the sampling plan are given to study the plan parameters with an example.
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V. Kaviyarasu, S. Sivasankari, "Acceptance Sampling Plan for Life Testing under Generalized Exponential-Poisson Distribution," International Journal of Mathematics Trends and Technology (IJMTT), vol. 66, no. 12, pp. 148-156, 2020. Crossref, https://doi.org/10.14445/22315373/IJMTT-V66I12P520
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